Title :
Fast search for worst-case test vectors for leakage current failure induced by total dose in standard-cell ASICs
Author :
Abdel-Aziz, H.A. ; Abou-Auf, A.A.
Author_Institution :
Electron. Eng. Dept., American Univ. in Cairo, Cairo, Egypt
Abstract :
We developed a fast search algorithm for identifying worst-case test vectors for leakage current failure induced in standard-cell ASICs exposed to total-ionizing dose radiation environment.
Keywords :
application specific integrated circuits; integrated circuit testing; leakage currents; fast search algorithm; leakage current failure; standard-cell ASIC; total-ionizing dose radiation environment; worst-case test vectors; Leakage current; Testing; CMOS; leakage current; total dose; worst-case test vectors;
Conference_Titel :
Design and Test Workshop (IDT), 2009 4th International
Conference_Location :
Riyadh
Print_ISBN :
978-1-4244-5748-9
DOI :
10.1109/IDT.2009.5404099
