• DocumentCode
    3363644
  • Title

    Silicon photodiode soft X-ray detectors for pulsed power experiments

  • Author

    Idzorek, G.C. ; Bartlett, R.J.

  • Author_Institution
    Div. of Phys., Los Alamos Nat. Lab., NM, USA
  • Volume
    2
  • fYear
    1997
  • fDate
    June 29 1997-July 2 1997
  • Firstpage
    1274
  • Abstract
    Silicon photodiodes offer a number of advantages over conventional photocathode type soft X-ray detectors in pulsed power experiments. These include a nominally flat response, insensitivity to surface contamination, low voltage biasing requirements, sensitivity to low energy photons, excellent detector to detector response reproducibility, and ability to operate in poor vacuum or gas backfilled experiments. Silicon photodiodes available from International Radiation Detectors (IRD), Torrance, California have been characterized for absolute photon response from 1 eV to 10 keV photon energy, time response, and signal saturation levels. Our calibration measurements show factor of ten deviations from the silicon photodiode theoretical flat response due to diode sensitivity outside the center ´sensitive area´. Detector response reproducibility between diodes appears to be better than 5%. Time response measurements show a 10-90% rise time of about 0.1 nanoseconds and a fall time of about 0.5 nanoseconds.
  • Keywords
    silicon; 1 eV to 10 keV; International Radiation Detectors; Si; Si photodiodes; absolute photon response; detector to detector response reproducibility; gas backfilled experiments; low energy photons sensitivity; low voltage biasing requirements; nominally flat response; poor vacuum experiments; pulsed power experiments; soft X-ray detectors; surface contamination insensitivity; time response measurements; Cathodes; Diodes; Photodiodes; Pollution measurement; Reproducibility of results; Response surface methodology; Silicon; Surface contamination; Time factors; X-ray detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 1997. Digest of Technical Papers. 1997 11th IEEE International
  • Conference_Location
    Baltimore, MA, USA
  • Print_ISBN
    0-7803-4213-5
  • Type

    conf

  • DOI
    10.1109/PPC.1997.674576
  • Filename
    674576