DocumentCode
3363644
Title
Silicon photodiode soft X-ray detectors for pulsed power experiments
Author
Idzorek, G.C. ; Bartlett, R.J.
Author_Institution
Div. of Phys., Los Alamos Nat. Lab., NM, USA
Volume
2
fYear
1997
fDate
June 29 1997-July 2 1997
Firstpage
1274
Abstract
Silicon photodiodes offer a number of advantages over conventional photocathode type soft X-ray detectors in pulsed power experiments. These include a nominally flat response, insensitivity to surface contamination, low voltage biasing requirements, sensitivity to low energy photons, excellent detector to detector response reproducibility, and ability to operate in poor vacuum or gas backfilled experiments. Silicon photodiodes available from International Radiation Detectors (IRD), Torrance, California have been characterized for absolute photon response from 1 eV to 10 keV photon energy, time response, and signal saturation levels. Our calibration measurements show factor of ten deviations from the silicon photodiode theoretical flat response due to diode sensitivity outside the center ´sensitive area´. Detector response reproducibility between diodes appears to be better than 5%. Time response measurements show a 10-90% rise time of about 0.1 nanoseconds and a fall time of about 0.5 nanoseconds.
Keywords
silicon; 1 eV to 10 keV; International Radiation Detectors; Si; Si photodiodes; absolute photon response; detector to detector response reproducibility; gas backfilled experiments; low energy photons sensitivity; low voltage biasing requirements; nominally flat response; poor vacuum experiments; pulsed power experiments; soft X-ray detectors; surface contamination insensitivity; time response measurements; Cathodes; Diodes; Photodiodes; Pollution measurement; Reproducibility of results; Response surface methodology; Silicon; Surface contamination; Time factors; X-ray detectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 1997. Digest of Technical Papers. 1997 11th IEEE International
Conference_Location
Baltimore, MA, USA
Print_ISBN
0-7803-4213-5
Type
conf
DOI
10.1109/PPC.1997.674576
Filename
674576
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