Title :
Soft Error Considerations for Multicore Microprocessor Design
Author :
Robinson, William H. ; Alles, Michael L. ; Bapty, Theodore A. ; Bhuva, Bharat L. ; Black, Jeffrey D. ; Bonds, Alfred B. ; Massengill, Lloyd W. ; Neema, Sandeep K. ; Schrimpf, Ronald D. ; Scott, Jason M.
Author_Institution :
Vanderbilt Univ., Nashville
fDate :
May 30 2007-June 1 2007
Abstract :
Advanced integrated circuits with reduced operating voltages and higher transistor densities exhibit increased sensitivity to radiation effects. This sensitivity is not confined to just memory but can affect all logic elements of the circuit. As such, radiation-induced soft errors are becoming a dominant reliability-failure mechanism in modern CMOS technologies. With the recent trend towards multicore microprocessors, designers must now consider how those multicore designs will perform taking into account the effects of soft errors. This paper discusses the relationships among process technology, architecture, communication, operating system, and applications when designing a multicore microprocessor. Several key design considerations are presented which exemplify the linkages among those design elements in multicore microprocessors.
Keywords :
CMOS integrated circuits; logic circuits; logic design; CMOS integrated circuits; advanced integrated circuits; multicore microprocessor design; radiation effects; radiation-induced soft errors; reliability-failure mechanism; CMOS logic circuits; CMOS technology; Integrated circuit reliability; Integrated circuit technology; Logic circuits; Microprocessors; Multicore processing; Radiation effects; Transistors; Voltage; CMOS integrated circuits; hardware/software co-design; radiation hardened by design (RHBD); single-event effects; soft error mitigation;
Conference_Titel :
Integrated Circuit Design and Technology, 2007. ICICDT '07. IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
1-4244-0757-5
Electronic_ISBN :
1-4244-0757-5
DOI :
10.1109/ICICDT.2007.4299574
