A Probabilistic Logic for Nanoscale Devices

Author

Lu, Xiaojun ; Song, Xiaoyu

Author_Institution

Univ. of Electron. Sci. & Technol., Chengdu

fYear

2007

fDate

May 30 2007-June 1 2007

Firstpage

1

Lastpage

4

Abstract

A logic with probabilistic characterization is suitable for expressing the states of nanoscale devices. This paper describes a novel method of calculating probability distribution of nano gate states. It is based on the Markov random field theory with new features, such as clique potential, probability density of initial nodes. We demonstrate the effectiveness of the method by basic gates and circuits. The analysis shows that the device probability distribution highly depends on the system structures and temperature parameters.

Keywords

Markov processes; logic circuits; logic gates; nanoelectronics; statistical distributions; Markov random field theory; digital circuits; nano gate states; nanoscale devices; probabilistic logic; probability distribution; Circuit analysis; Logic devices; Markov random fields; Nanoelectronics; Nanoscale devices; Physics; Probabilistic logic; Probability distribution; Temperature dependence; Temperature distribution; MRF; digital circuits; nano science; probability;

fLanguage

English

Publisher

ieee

Conference_Titel

Integrated Circuit Design and Technology, 2007. ICICDT '07. IEEE International Conference on

Conference_Location

Austin, TX

Print_ISBN

1-4244-0757-5

Electronic_ISBN

1-4244-0757-5

Type

conf

DOI

10.1109/ICICDT.2007.4299579

Filename

4299579