DocumentCode :
3364130
Title :
Systematic modeling of on-chip power grids with decaps in TSV-based 3D chip integration
Author :
Oo, Zaw Zaw
Author_Institution :
Electron. & Photonics Dept., A*STAR, Singapore, Singapore
fYear :
2013
fDate :
11-13 Dec. 2013
Firstpage :
575
Lastpage :
578
Abstract :
Efficient modeling of power supply noises is crucial for a robust power supply design, especially with increase in the size of on-chip power grids due to emerging 3D chip integration technology. As the power grid is interconnected vertically by through-silicon vias (TSVs), operational currents required by each functional device in integrated circuits (ICs) are supplied through vertical power and ground TSVs, and horizontal power grids. Fast switching speed of the devices become complicated the accurate analysis of the worst case power supply noises. In this paper, a systematic modeling of on-chip power grids with decoupling capacitors - VNCAPs - used in TSV-based chip integration technology is presented using novel equivalent decap circuit model. The equivalent circuit model will be numerically validated and integrated into an efficient modeling for impedance profile of on-chip power grids and analysis of power supply noises in TSV-based 3D chip integration technology.
Keywords :
integrated circuit interconnections; integrated circuit modelling; power supply circuits; system-on-chip; three-dimensional integrated circuits; TSV based 3D chip integration; VNCAP; decoupling capacitors; equivalent decap circuit model; fast switching speed; horizontal power grids; integrated circuits; on chip power grids; operational currents; power supply noises; robust power supply design; systematic modeling; through silicon vias; Analytical models; Capacitors; Integrated circuit modeling; Noise; Power grids; System-on-chip; Three-dimensional displays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC 2013), 2013 IEEE 15th
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-2832-3
Type :
conf
DOI :
10.1109/EPTC.2013.6745785
Filename :
6745785
Link To Document :
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