• DocumentCode
    3364130
  • Title

    Systematic modeling of on-chip power grids with decaps in TSV-based 3D chip integration

  • Author

    Oo, Zaw Zaw

  • Author_Institution
    Electron. & Photonics Dept., A*STAR, Singapore, Singapore
  • fYear
    2013
  • fDate
    11-13 Dec. 2013
  • Firstpage
    575
  • Lastpage
    578
  • Abstract
    Efficient modeling of power supply noises is crucial for a robust power supply design, especially with increase in the size of on-chip power grids due to emerging 3D chip integration technology. As the power grid is interconnected vertically by through-silicon vias (TSVs), operational currents required by each functional device in integrated circuits (ICs) are supplied through vertical power and ground TSVs, and horizontal power grids. Fast switching speed of the devices become complicated the accurate analysis of the worst case power supply noises. In this paper, a systematic modeling of on-chip power grids with decoupling capacitors - VNCAPs - used in TSV-based chip integration technology is presented using novel equivalent decap circuit model. The equivalent circuit model will be numerically validated and integrated into an efficient modeling for impedance profile of on-chip power grids and analysis of power supply noises in TSV-based 3D chip integration technology.
  • Keywords
    integrated circuit interconnections; integrated circuit modelling; power supply circuits; system-on-chip; three-dimensional integrated circuits; TSV based 3D chip integration; VNCAP; decoupling capacitors; equivalent decap circuit model; fast switching speed; horizontal power grids; integrated circuits; on chip power grids; operational currents; power supply noises; robust power supply design; systematic modeling; through silicon vias; Analytical models; Capacitors; Integrated circuit modeling; Noise; Power grids; System-on-chip; Three-dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC 2013), 2013 IEEE 15th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4799-2832-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2013.6745785
  • Filename
    6745785