• DocumentCode
    3364499
  • Title

    High frequency imaging transducers from hollow spheres

  • Author

    Meyer, R., Jr. ; Alkoy, S. ; Chen, W. ; Ritter, T. ; Cochran, J., Jr. ; Newnham, R.

  • Author_Institution
    Mater. Res. Lab., Pennsylvania State Univ., University Park, PA, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    741
  • Abstract
    Single element transducers were designed and built using shelf sections of piezoelectric hollow spheres. The shell sections provide inherent focal depths and allow for the easy production of low f-number transducers. Because of the low f-numbers, these transducers have improved lateral resolution compared to other transducers operating at the same frequency. Spheres were mass-produced using the sacrificial core technique and had diameters of 1-3 mm and wall thickness from 20 to 120 μm. The lead titanate transducers described here had thickness mode resonance frequencies ranging from 25 MHz to 70 MHz. Electromechanical properties and pulse-echo response of these transducers were evaluated. Skin images taken with an Ultrasonic Backscatter Microscope at 55 MHz are also presented
  • Keywords
    lead compounds; piezoelectric transducers; ultrasonic focusing; ultrasonic imaging; ultrasonic transducers; 25 to 70 MHz; PbTiO3; electromechanical properties; f-number; focal depth; high-frequency imaging transducer; lateral resolution; lead titanate; mass production; piezoelectric hollow sphere; pulse-echo response; sacrificial core technique; shell section; single element transducer; skin image; thickness mode resonance frequency; ultrasonic backscatter microscope; Backscatter; High-resolution imaging; Microscopy; Piezoelectric transducers; Production; Resonance; Resonant frequency; Skin; Titanium compounds; Ultrasonic transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1099-4734
  • Print_ISBN
    0-7803-5940-2
  • Type

    conf

  • DOI
    10.1109/ISAF.2000.942426
  • Filename
    942426