DocumentCode
3365616
Title
A dissimilarity kernel with local features for robust facial recognition
Author
Huang, Weilin ; Yin, Hujun
Author_Institution
Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester, UK
fYear
2010
fDate
26-29 Sept. 2010
Firstpage
3785
Lastpage
3788
Abstract
Local binary pattern (LBP) has recently been proposed for texture analysis and local feature description and has also been applied to face recognition with promising results. However, besides the descriptors, a suitable similarity measure that can efficiently learn to distinguish facial features is also important. In this paper, a novel framework for robust face recognition is presented that considers both local and global features by using multi-resolution LBP descriptors. The framework can tolerate variations in expression, lighting condition and occlusion. A weighted distance measure is used to learn the dissimilarity between sets of LBP features. We formulate the distance function as a conditionally positive semi-definite (CPD) kernel, thus making it suitable for kernel-based algorithms such as support vector machines (SVMs) whose optimal solutions are guaranteed. We show that by defining it in a Hilbert space, the proposed CPD kernel has advantages over traditional methods computing the l2 distances in the Euclidean space. The experiments show that the approach is efficient and significantly outperforms the current state-of-the-art methods on the publicly available AR face database.
Keywords
Hilbert spaces; face recognition; Hilbert space; dissimilarity kernel; distance function; global feature; kernel based algorithm; local binary pattern; local feature; positive semidefinite kernel; robust facial recognition; texture analysis; Face; Face recognition; Histograms; Kernel; Lighting; Robustness; Training; Local binary pattern; conditionally positive semi-definite kernel; dissimilarity measure; local feature; robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location
Hong Kong
ISSN
1522-4880
Print_ISBN
978-1-4244-7992-4
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2010.5653495
Filename
5653495
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