DocumentCode
3365702
Title
Modeling the effects of broadening and degradation of single event transient pulses in integrated circuits
Author
Ribeiro, Ivandro ; Wirth, Gilson ; Kastensmidt, Fernanda Lima
Author_Institution
Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
fYear
2008
fDate
10-12 Sept. 2008
Firstpage
192
Lastpage
197
Abstract
We compare the behavior of transient pulse propagation from laser testing presented in with electrical simulations, and present an analytical model that considers SET broadening and degradation in integrated circuits.
Keywords
integrated circuit testing; radiation effects; SET broadening; SET degradation; analytical model; electrical simulation; integrated circuits; laser testing; single event transient pulses; transient pulse propagation; Analytical models; Integrated circuit modeling; Inverters; Load modeling; Logic gates; Mathematical model; Transient analysis; SET propagation modeling; Single Event Transient; fault injection;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Conference_Location
Jyvaskyla
ISSN
0379-6566
Print_ISBN
978-1-4577-0481-9
Type
conf
DOI
10.1109/RADECS.2008.5782710
Filename
5782710
Link To Document