Title :
An Embedded Test Circuit for RF Single Ended Low Noise Amplifiers
Author :
Dermentzoglou, L. ; Karagounis, A. ; Arapoyanni, A. ; Tsiatouhas, Y.
Author_Institution :
Univ. of Athens, Athens
Abstract :
This paper presents a cost effective Embedded Test Circuit (ETC) for single ended Low Noise Amplifiers (LNAs). The ETC operation is based on the observation that the presence of catastrophic faults, like resistive bridgings, shorts and opens, or parametric faults, result in the attenuation of the output voltage amplitude (gain reduction). The ETC along with a single ended LNA have been designed in a 0.35¿m CMOS technology to evaluate the efficiency of the proposed approach and experimental results are presented.
Keywords :
integrated circuit testing; low noise amplifiers; CMOS technology; RF single ended LNA; catastrophic faults; embedded test circuit; low noise amplifiers; output voltage amplitude; parametric faults; resistive bridgings; Attenuation; CMOS technology; Circuit faults; Circuit noise; Circuit testing; Costs; Low-noise amplifiers; Radio frequency; Radiofrequency amplifiers; Voltage;
Conference_Titel :
Electronics, Circuits and Systems, 2007. ICECS 2007. 14th IEEE International Conference on
Conference_Location :
Marrakech
Print_ISBN :
978-1-4244-1377-5
Electronic_ISBN :
978-1-4244-1378-2
DOI :
10.1109/ICECS.2007.4511191
