• DocumentCode
    3368321
  • Title

    Redundant-wires-aware ECO timing and mask cost optimization

  • Author

    Fang, Shao-Yun ; Chien, Tzuo-Fan ; Chang, Yao-Wen

  • Author_Institution
    Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2010
  • fDate
    7-11 Nov. 2010
  • Firstpage
    381
  • Lastpage
    386
  • Abstract
    Spare cells are often used in engineering change order (ECO) timing optimization. By applying spare-cell rewiring techniques, timing-violated paths in a design can be fixed. In addition, mask re-spin cost economization has become a critical challenge for modern IC design, and it can be achieved by reducing the number of layers used to rewire spare cells. This paper presents the first work for the problem of ECO timing optimization considering redundant wires (unused wires or dummy metals) to minimize the number of rewiring layers. We first propose a multi-commodity flow model for the spare-cell selection problem and apply integer linear programming (ILP) to simultaneously optimize all timing-violated paths. The ILP formulation minimizes the number of used spare cells and considers the routability of the selected spare cells. Then, we develop a tile-based ECO router which minimizes the number of rewiring layers by reusing redundant wires. Experimental results based on five industry benchmarks show that our algorithm not only effectively resolves timing violations but also reduces the number of rewiring layers under reasonable runtime.
  • Keywords
    masks; network synthesis; timing; wires; dummy metals; engineering change order timing optimization; integer linear programming; mask cost optimization; redundant wires; redundant-wires-aware eco timing; selected spare cells; spare-cell rewiring; spare-cell selection; timing-violated paths; Biological system modeling; Logic gates; Metals; Optimization; Routing; Timing; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4244-8193-4
  • Type

    conf

  • DOI
    10.1109/ICCAD.2010.5653648
  • Filename
    5653648