• DocumentCode
    3369282
  • Title

    Fault-tolerant architecture for nanoelectronic digital logic

  • Author

    Flak, Jacek ; Laiho, Mika ; Paasio, Ari

  • Author_Institution
    VTT Tech. Res. Centre of Finland, Espoo
  • fYear
    2008
  • fDate
    14-17 Sept. 2008
  • Firstpage
    545
  • Lastpage
    548
  • Abstract
    This paper presents a new system architecture for implementing fault-tolerant information processing. The proposed structure relies on simple processing elements (PEs) arranged into a regular locally-interconnected array. Such an approach is a favorable way of implementing circuits with inherently unreliable nanodevices. Different network operations are achieved through binary programmable interconnections. The array can be divided into a set of software-defined segments for implementing functions with different levels of complexity and redundancy, assuring the system versatility and flexibility. The examples of basic Boolean operations are presented. The error correction mechanism is explained and its impact on fault-tolerance is briefly analyzed.
  • Keywords
    Boolean functions; cellular neural nets; error correction; fault tolerance; integrated circuit interconnections; integrated circuit reliability; integrated logic circuits; logic gates; nanoelectronics; Boolean operations; binary programmable interconnections; cellular neural network; circuit implementation; error correction mechanism; fault-tolerant information processing; locally-interconnected array; nanodevices; nanoelectronic digital logic; nanotechnology; software-defined segments; CMOS technology; Energy efficiency; Error correction; Fault tolerance; Fault tolerant systems; Integrated circuit interconnections; Logic; Nanoscale devices; Nanotechnology; Redundancy; Fault tolerance; cellular architecture; gate arrays; nanotechnology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signals and Electronic Systems, 2008. ICSES '08. International Conference on
  • Conference_Location
    Krakow
  • Print_ISBN
    978-83-88309-47-2
  • Electronic_ISBN
    978-83-88309-52-6
  • Type

    conf

  • DOI
    10.1109/ICSES.2008.4673493
  • Filename
    4673493