The use of variable load for RF circuit testing

Author

Kyziol, Piotr ; Grzechca, Damian ; Golonek, Tomasz ; Rutkowski, Jerzy

Author_Institution

Inst. of Electron., Silesian Univ. of Technol., Gliwice

fYear

2008

fDate

14-17 Sept. 2008

Firstpage

557

Lastpage

560

Abstract

The testing and diagnosis catastrophic faults technique for analog high frequency (HF) circuits (passive filters and impedance matching circuits) is described in this paper. The novel method based on load and frequency as testing pair has been proposed. The impact of load on testing and diagnostic has been investigated. The best pairs of load and frequency have been chosen. The proposed approach of testing analog HF circuits allows to increase diagnostic CUT with catastrophic faults and tolerance dispersion. The testing method has been checked for impedance matching circuit from RFID HF reader.

Keywords

circuit testing; impedance matching; radiofrequency integrated circuits; RF circuit testing; analog high frequency circuits; catastrophic faults; impedance matching circuits; passive filters; tolerance dispersion; variable load; Circuit faults; Circuit testing; Electronic equipment testing; Electronic mail; Fault diagnosis; Hafnium; Impedance matching; Power measurement; Radio frequency; System testing; Impedance matching; RF testing; RFID;

fLanguage

English

Publisher

ieee

Conference_Titel

Signals and Electronic Systems, 2008. ICSES '08. International Conference on

Conference_Location

Krakow

Print_ISBN

978-83-88309-47-2

Electronic_ISBN

978-83-88309-52-6

Type

conf

DOI

10.1109/ICSES.2008.4673496

Filename

4673496