DocumentCode :
3369479
Title :
A ray tracing method for predicting path loss and delay spread in microcellular environments
Author :
Schaubach, Kurt R. ; Davis, Nathaniel J., IV ; Rappaport, Theodore S.
Author_Institution :
Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
fYear :
1992
fDate :
10-13 May 1992
Firstpage :
932
Abstract :
The ability to predict path loss and delay spread is crucial for determining coverage and for planning interference reduction strategies in wireless radio system design. A promising theoretical method to accurately predict these channel characteristics in microcells is presented. The method uses modified geometrical optics to evaluate average path loss and delay spread. Quantitative building data, such as location, height, and electrical properties, are used to determine the individual multipath component amplitudes and delays. Preliminary verification of the technique against measured data has been conducted. The results illustrate that accurate path loss prediction is possible, with predicted values being within 5 dB of the measured values. As a result of this study, a computer program is being developed to automate the prediction process. The technical issues required for automated propagation prediction are presented. The ray optics model, computer ray tracing techniques, and building data requirements are also described. Comparisons between simulations and measurements are provided
Keywords :
cellular radio; delays; losses; radiowave propagation; ray tracing; telecommunications computing; automated propagation prediction; building data; computer ray tracing techniques; coverage; delay spread; electrical properties; height; interference reduction strategies; location; microcells; modified geometrical optics; multipath component amplitudes; multipath component delays; path loss prediction; ray optics model; wireless radio system design; Buildings; Delay; Geometrical optics; Interference; Microcell networks; Optical computing; Optical losses; Path planning; Ray tracing; Strategic planning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicular Technology Conference, 1992, IEEE 42nd
Conference_Location :
Denver, CO
ISSN :
1090-3038
Print_ISBN :
0-7803-0673-2
Type :
conf
DOI :
10.1109/VETEC.1992.245274
Filename :
245274
Link To Document :
بازگشت