• DocumentCode
    3369868
  • Title

    A two-tap voltage-mode transmitter with adaptive de-emphasis and impedance self-calibration in 45 nm CMOS

  • Author

    Tai, L. ; Mustaffa, M.T. ; Chan, K.H.

  • Author_Institution
    Intel Corp., Bayan Lepas, Malaysia
  • Volume
    2
  • fYear
    2012
  • fDate
    12-14 June 2012
  • Firstpage
    755
  • Lastpage
    760
  • Abstract
    This paper describes a low power two-tap voltage-mode transmitter (Tx) in 45 nm CMOS process technology with adaptive de-emphasis and impedance self-calibration in which the adaptive de-emphasis is independent of the impedance self-calibration. The Tx comprises of eight identical slice units where the impedance of each slice unit is controlled by impedance calibration circuit to match the characteristic impedance of the transmission line. Voltage-mode (VM) driver can save 75 % static output power compared to current-mode (CM) driver. The proposed design provides a differential output swing of 800 mV-1200 mV across process, voltage and temperature (PVT) variation with a power consumption of 10 mW at a data rate of 5 Gb/s under a supply voltage of 1 V. The eye of the received data has 0.9 unit interval (UI) timing margin when the data signals are sent over 20" FR4 channel.
  • Keywords
    CMOS digital integrated circuits; driver circuits; impedance matching; transmitters; CMOS integrated circuit; FR4 channel; adaptive deemphasis; bit rate 5 Gbit/s; characteristic impedance matching; impedance calibration circuit; impedance self-calibration; power 10 mW; process variation; size 45 nm; slice unit; temperature variation; two tap voltage mode transmitter; voltage 1 V; voltage mode driver; voltage variation; Calibration; Impedance; MOSFETs; Power transmission lines; Resistance; Resistors; Transmitters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent and Advanced Systems (ICIAS), 2012 4th International Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4577-1968-4
  • Type

    conf

  • DOI
    10.1109/ICIAS.2012.6306114
  • Filename
    6306114