• DocumentCode
    3370309
  • Title

    Mechanisms for Explosively-Formed Fuse Performance Degradation

  • Author

    Tasked, D.G. ; Goforth, James H. ; Fowler, Clarence M. ; Herrera, Dennis H. ; Torres, David T. ; King, James C. ; Oona, Henn ; Kiuttu, Gerald F. ; Degnan, James H. ; Domonkos, Matthew T. ; Lehr, F. Mark ; Ruden, Edward L. ; Tucker, Wesley D. ; Cavazos, Th

  • Author_Institution
    Los Alamos Nat. Lab., Los Alamos, NM
  • fYear
    2005
  • fDate
    13-17 June 2005
  • Firstpage
    441
  • Lastpage
    444
  • Abstract
    The Explosively-Formed Fuse (EFF) is a high-power opening switch that uses an explosive charge to interrupt current flow in an aluminum conductor [1]. As such we expected the foil´s resistance to increase with increasing current density by Joule heating. Yet an analysis of a large number of experiments clearly showed the opposite was true; there was a strong negative correlation between the peak resistance and current density. In the paper we analyze various possible causes including thermal softening of the metal, magnetic loading of the explosive and electric breakdown or conduction in the product gases at the higher applied fields. Our analysis suggests that magnetic loading is responsible for the degradation.
  • Keywords
    current density; electric breakdown; electric fuses; switchgear; Joule heating; aluminum conductor; current density; electric breakdown; explosive charge; explosively-formed fuse performance degradation; high-power opening switch; magnetic loading; peak resistance; thermal softening; Aluminum; Conductors; Current density; Degradation; Electric resistance; Explosives; Fuses; Magnetic analysis; Resistance heating; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 2005 IEEE
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-7803-9189-6
  • Electronic_ISBN
    0-7803-9190-x
  • Type

    conf

  • DOI
    10.1109/PPC.2005.300683
  • Filename
    4084246