• DocumentCode
    3372196
  • Title

    Variable-resolution simulation of nonlinear power circuits

  • Author

    Davoudi, Ali ; Dhople, Sairja ; Chapman, Patrick L. ; Jatskevich, Juri

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    2750
  • Lastpage
    2753
  • Abstract
    Highly detailed models of power converters can be slow to simulate due to the wide disparity in transient time scales. This is further pronounced in the presence of nonlinear components, e.g., saturated inductors. Variable-resolution simulation provides an alternative method by providing an appropriate amount of detail based on the time scale and phenomenon being considered. First, a high-fidelity detailed full-order model of the converter is built that accounts for the system parasitics and higher order effects, component nonlinearity, etc. Efficient order-reduction techniques are then used to extract several lower order models for the desired resolution of the simulation. The state continuity across different resolutions and switching events is ensured using appropriate similarity transforms. The proposed variable-resolution simulation framework is demonstrated on a boost converter with a saturated inductor. Significant improvement in simulation speed (orders of magnitude) is reported.
  • Keywords
    power convertors; power electronics; boost converter; component nonlinearity; efficient order-reduction technique; nonlinear power circuits; power converter; saturated inductor; similarity transform; state continuity; transient time scale; variable-resolution simulation framework; Circuit simulation; Computational modeling; Computer simulation; Diodes; Inductance; Inductors; MOSFET circuits; Power engineering computing; Switches; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537026
  • Filename
    5537026