• DocumentCode
    3373103
  • Title

    A Time-Domain Method for Pseudo-Spectral Characterization

  • Author

    Mishra, Apurva ; Soma, Mani

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Washington, Seattle, WA
  • fYear
    2008
  • fDate
    April 27 2008-May 1 2008
  • Firstpage
    163
  • Lastpage
    168
  • Abstract
    We present a generic method for determining transfer function of a DUT using simple time-domain computations in place of conventional computationally intensive frequency domain methods. Our method uses a chirp stimulus and an average of absolute value to extract energy in different frequency bins. For an No-size spectrum, this enables a reduction of computational complexity from No In No multiply-accumulates (using an FFT) to No accumulates. This makes it an attractive strategy for BIST. We present the theoretical basis, test case simulations, and a comparison with the FFT method.
  • Keywords
    mixed analogue-digital integrated circuits; time-domain analysis; FFT method; chirp stimulus; pseudo-spectral characterization; time-domain method; transfer function; Built-in self-test; Circuit faults; Circuit testing; Computational complexity; Computational modeling; Frequency domain analysis; Radio frequency; Spectral analysis; Time domain analysis; Transfer functions; analog test; bist; fft; mixed-signal test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-0-7695-3123-6
  • Type

    conf

  • DOI
    10.1109/VTS.2008.50
  • Filename
    4511716