• DocumentCode
    3373555
  • Title

    Shifting time waveform induced CMOS latch up in bootstrapping technique applications

  • Author

    Purwadi ; Bai, Shu-Ming ; Prabowo, Briliant Adhi ; Tsai, Jung-Ruey ; Sheu, Gene

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Asia Univ., Taichung, Taiwan
  • fYear
    2012
  • fDate
    2-6 July 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this study, latch-up mechanisms of the complementary-metal-oxide-semiconductor (CMOS) in bootstrapping technique applied to DC/DC buck converter circuit has been clearly investigated by two dimensional (2D) TCAD simulations. The shifting times of input signal waveforms were demonstrated to be the key factor to induce the CMOS latch-up due to the triggering of parasitic bipolar junction transistors (BJTs) in the CMOS bootstrapping application. In addition, the free latch-up design window suggests that both of the larger rise time and longer shifting times of input signal waveforms will provide a larger safety operation region for circuit design engineers in this work.
  • Keywords
    CMOS logic circuits; DC-DC power convertors; bipolar transistors; bootstrap circuits; flip-flops; logic design; technology CAD (electronics); 2D TCAD simulations; BJT; CMOS bootstrapping application; CMOS latch up; DC/DC buck converter circuit; bootstrapping technique applications; circuit design engineers; complementary-metal-oxide-semiconductor; free latch-up design window; input signal waveforms; latch-up mechanisms; parasitic bipolar junction transistors; safety operation region; shifting time waveform; shifting times; CMOS integrated circuits; CMOS technology; Integrated circuit modeling; Latches; Reliability; Semiconductor device modeling; Transistors; Bootstrapping; CMOS; Latch-up; Shifting time waveform; TCAD;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the
  • Conference_Location
    Singapore
  • ISSN
    1946-1542
  • Print_ISBN
    978-1-4673-0980-6
  • Type

    conf

  • DOI
    10.1109/IPFA.2012.6306305
  • Filename
    6306305