DocumentCode
3373613
Title
Low Complexity Testing Micromachines Revealing Size-Dependent Mechanical Properties of Thin Al Films
Author
Raskin, J.P. ; Fabrègue, D. ; André, N. ; Coulombier, M. ; Pardoen, T.
Author_Institution
Res. Center in Micro & Nanoscopic Mater. & Electron. Devices, Louvain-la-Neuve
fYear
2007
fDate
10-14 June 2007
Firstpage
619
Lastpage
622
Abstract
The mechanical properties measurement of materials with submicron dimensions is extremely challenging, from the preparation and manipulation of specimens, to the application of small loads and extraction of accurate stresses and strains. Here, we describe a novel, versatile concept of micro and nano- machines to test films or beams with characteristic dimensions ranging between 10 nm to 1 mum, allowing multiple loading configurations and geometries. This testing method has been applied to thin, pure aluminium films. The yield strength linearly increases with the inverse of the film thickness, reaching 625 MPa for 150 nm thickness which is 10 times larger than for macroscopic samples.
Keywords
aluminium; mechanical testing; micromechanical devices; nanostructured materials; thin films; yield strength; aluminium films; loading configurations; low complexity testing micromachines; nanomachines; submicron dimensions; thin Al films; yield strength; Actuators; Capacitive sensors; Computational modeling; Deformable models; Materials testing; Mechanical factors; Mechanical variables measurement; Micromechanical devices; Nanostructured materials; Plastic films; MEMS; Mechanical properties testing; Plastic deformation; Thin films;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
Conference_Location
Lyon
Print_ISBN
1-4244-0841-5
Electronic_ISBN
1-4244-0842-3
Type
conf
DOI
10.1109/SENSOR.2007.4300206
Filename
4300206
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