DocumentCode
3373633
Title
A High-Sensitivity Photon Emission Microscope System with Continuous Wavelength Spectroscopic Capabi
Author
Tao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
fYear
1996
fDate
April 30 1996-May 2 1996
Firstpage
360
Keywords
Failure analysis; Optical coupling; Optical filters; Optical imaging; Optical microscopy; Optical sensors; Photonic integrated circuits; Spectral analysis; Spectroscopy; Stimulated emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1996. 34th Annual Proceedings., IEEE International
Conference_Location
Dallas, TX, USA
Print_ISBN
0-7803-2753-5
Type
conf
DOI
10.1109/RELPHY.1996.492143
Filename
492143
Link To Document