• DocumentCode
    3374417
  • Title

    Application of event related brain potentials to communication aids

  • Author

    Kawakami, Takashi ; Inoue, Michio ; Kobayashi, Yasuhiro ; Nakashima, Kenji

  • Author_Institution
    Tottori Sanyo Electr. Co. Ltd., Japan
  • Volume
    5
  • fYear
    1996
  • fDate
    31 Oct-3 Nov 1996
  • Firstpage
    2229
  • Abstract
    This paper gives a brief explanation of event related brain potentials (ERPs) within an electroencephalogram (EEG) and discusses a method for their clear detection. An ERP is evoked as an inner psychological response to an outward physical stimulus. Basically, one is able to know when another person has a greater interest in one of various targets by detecting the ERP. The ERP appears from about 100 to 600 ms after the stimulating impulse. Unfortunately, the ERP is so weak as to be buried under the EEG. To detect the ERP, EEG records are transformed into a Haar-wavelet series, and accumulated over every stimulus. If one can characterize visual stimuli by any feature and arrange them in a semantic order, one is able to understand what a companion thinks. This means that one can have some conversation with a serious amyotrophic lateral sclerosis patient via a series of questions and answers
  • Keywords
    electroencephalography; handicapped aids; medical signal processing; visual evoked potentials; wavelet transforms; 100 to 600 ms; Haar-wavelet series; answers; communication aids; event related brain potentials; inner psychological response; outward impulses; outward physical stimulus; questions; semantic order; serious amyotrophic lateral sclerosis patient; visual stimuli characterization; Back; Communication aids; Diseases; Electroencephalography; Enterprise resource planning; Event detection; Gas detectors; Knowledge engineering; Layout; Psychology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
  • Conference_Location
    Amsterdam
  • Print_ISBN
    0-7803-3811-1
  • Type

    conf

  • DOI
    10.1109/IEMBS.1996.646509
  • Filename
    646509