Title :
On-Chip Antenna Measurements: Calibration and De-embedding Considerations
Author :
Shamim, Atif ; Roy, Langis ; Fong, Neric ; Tarr, Gary ; Levenets, Vlad
Author_Institution :
Dept. of Electron., Carleton Univ., Ottawa, Ont.
Abstract :
This paper presents the design and implementation of an integrated balun for testing 24 GHz on-chip differential antennas. The balun is completely characterized on lossy Si substrate for subsequent de-embedding of the antenna impedance. A simple de-embedding technique is developed and verified to extract differential antenna impedance from single-ended S-parameters. The gain of the on-chip antennas is easily estimated through a novel gain calibration technique. Finally, near to far field transformation is employed to extract full radiation patterns
Keywords :
S-parameters; antenna radiation patterns; antenna testing; baluns; electric impedance; gain measurement; microwave antennas; 24 GHz; de-embedding technique; differential antenna impedance; far field transformation; gain calibration; gain measurement; integrated balun; lossy Si substrate; near field transformation; on-chip antenna measurements; on-chip differential antennas; radiation patterns; single-ended S-parameters; Antenna measurements; Antenna radiation patterns; Calibration; Costs; Electronic equipment testing; Impedance matching; Probes; Scattering parameters; System-on-a-chip; Transmitting antennas; balun; de-embedding; gain measurement; on-chip antenna;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
DOI :
10.1109/IMTC.2005.1604158
