On-Chip Antenna Measurements: Calibration and De-embedding Considerations

Author

Shamim, Atif ; Roy, Langis ; Fong, Neric ; Tarr, Gary ; Levenets, Vlad

Author_Institution

Dept. of Electron., Carleton Univ., Ottawa, Ont.

Volume

1

fYear

2005

fDate

16-19 May 2005

Firstpage

463

Lastpage

466

Abstract

This paper presents the design and implementation of an integrated balun for testing 24 GHz on-chip differential antennas. The balun is completely characterized on lossy Si substrate for subsequent de-embedding of the antenna impedance. A simple de-embedding technique is developed and verified to extract differential antenna impedance from single-ended S-parameters. The gain of the on-chip antennas is easily estimated through a novel gain calibration technique. Finally, near to far field transformation is employed to extract full radiation patterns

Keywords

S-parameters; antenna radiation patterns; antenna testing; baluns; electric impedance; gain measurement; microwave antennas; 24 GHz; de-embedding technique; differential antenna impedance; far field transformation; gain calibration; gain measurement; integrated balun; lossy Si substrate; near field transformation; on-chip antenna measurements; on-chip differential antennas; radiation patterns; single-ended S-parameters; Antenna measurements; Antenna radiation patterns; Calibration; Costs; Electronic equipment testing; Impedance matching; Probes; Scattering parameters; System-on-a-chip; Transmitting antennas; balun; de-embedding; gain measurement; on-chip antenna;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE

Conference_Location

Ottawa, Ont.

Print_ISBN

0-7803-8879-8

Type

conf

DOI

10.1109/IMTC.2005.1604158

Filename

1604158