DocumentCode
3374657
Title
Determination of thickness and dielectric constant of coatings from capacitance measurements
Author
Guadanama-Santana, A. ; Valenzuela, A. Garcia
Author_Institution
Centro de Ciencias Aplicadas y Desarrollo Tecnologico, Univ. Nacional Autonoma de Mexico, Coyoacan
Volume
1
fYear
2005
fDate
16-19 May 2005
Firstpage
488
Lastpage
492
Abstract
We show it is possible to measure both the dielectric constant and thickness of dielectric coating on a flat conducting substrate from two capacitance measurements. We discuss the principles of measurement, present numerical simulations, and a proof of principle experiment
Keywords
capacitance measurement; dielectric materials; permittivity measurement; thickness measurement; capacitance measurements; dielectric coating; dielectric constant determination; flat conducting substrate; thickness determination; Capacitance measurement; Coatings; Dielectric constant; Dielectric measurements; Thickness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location
Ottawa, Ont.
Print_ISBN
0-7803-8879-8
Type
conf
DOI
10.1109/IMTC.2005.1604163
Filename
1604163
Link To Document