DocumentCode
3375867
Title
Modeling of simultaneous switching ground noise for BiCMOS drivers
Author
Seeker, D.A. ; Prince, J.L.
Author_Institution
Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
fYear
1995
fDate
2-4 Oct 1995
Firstpage
33
Lastpage
36
Abstract
A model of simultaneous switching ground noise for the BiCMOS driver is presented. Level I SPICE-type MOSFET and Gummel-Poon BJT device models are used for the analysis. Immunity of the quiet BiCMOS driver to noise present at the ground and power connections is also investigated
Keywords
BiCMOS integrated circuits; SPICE; circuit analysis computing; integrated circuit modelling; integrated circuit noise; integrated circuit packaging; BiCMOS drivers; Gummel-Poon BJT device; Level I SPICE-type MOSFET; ground connections; power connections; semiconductor device models; simultaneous switching ground noise; BiCMOS integrated circuits; Circuit noise; Driver circuits; Electronics packaging; Integrated circuit noise; MOSFET circuits; Production; Semiconductor device noise; Switches; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 1995
Conference_Location
Portland, OR
Print_ISBN
0-7803-3034-X
Type
conf
DOI
10.1109/EPEP.1995.524687
Filename
524687
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