• DocumentCode
    3376204
  • Title

    Dispersion characteristics of multilayer coplanar waveguide using Single Layer Reduction (SLR) technique

  • Author

    Singh, Paramjeet ; Verma, A.K.

  • Author_Institution
    Dept. of Electron. Sci., Univ. of Delhi South Campus, New Delhi, India
  • fYear
    2011
  • fDate
    14-16 Jan. 2011
  • Firstpage
    71
  • Lastpage
    74
  • Abstract
    In this paper the Single Layer Reduction (SLR) technique is presented to compute dispersion characteristics of multilayer coplanar waveguide (CPW) with finite conductor thickness. The effective relative permittivity for the multilayer structure is derived from conformal mapping. Then SLR technique is used to convert multilayer CPW structure to an equivalent single layer structure. The dispersion characteristic of equivalent CPW structure is calculated from the closed form expressions.
  • Keywords
    conformal mapping; coplanar waveguides; conformal mapping; dispersion characteristics; finite conductor thickness; multilayer coplanar waveguide; single layer reduction technique; Coplanar waveguides; Nonhomogeneous media; Coplanar Waveguide (CPW); Dispersion; Single Layer Reduction (SLR);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Students' Technology Symposium (TechSym), 2011 IEEE
  • Conference_Location
    Kharagpur
  • Print_ISBN
    978-1-4244-8941-1
  • Type

    conf

  • DOI
    10.1109/TECHSYM.2011.5783804
  • Filename
    5783804
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3376204