DocumentCode
3376248
Title
A Diversity-Based Approach for Communication Integrity in Critical Embedded Systems
Author
Zammali, Amira ; De Bonneval, Agnan ; Crouzet, Yves
Author_Institution
LAAS, Toulouse, France
fYear
2015
fDate
8-10 Jan. 2015
Firstpage
215
Lastpage
222
Abstract
We present, in this paper, a fault-tolerant approach to cope with accidental communication data corruption in critical embedded systems. One of the classical integrity approaches is the redundancy-based approach that consists particularly in replicating the message and sending all copies via the same communication channel consecutively or sending them via replicated communication channels. Yet, such approach is vulnerable to some cases of Common-Mode Failure. So, we propose to diversify the copies to be sent via two independent proposals: i) diversifying either the error detection function (which generate the check bits) or ii) the data payload. This paper focus on the first proposal by presenting experiments and results to validate its effectiveness. Besides, it describes basic theoretical concepts of the second proposal. Our case study is the Flight Control System (FCS). Yet, our approach could be deployed in other systems for which we describe the key properties.
Keywords
aerospace control; control engineering computing; embedded systems; fault tolerant computing; redundancy; system recovery; telecommunication channels; FCS; accidental communication data corruption; check bit; common-mode failure; communication integrity; critical embedded system; data payload; diversity-based approach; error detection function; fault-tolerant approach; flight control system; independent proposal; redundancy-based approach; replicated communication channel; Aerospace control; Computational efficiency; Embedded systems; Payloads; Proposals; Redundancy; Safety; communication integrity; critical embedded systems; diversity; fault tolerance; flight control system;
fLanguage
English
Publisher
ieee
Conference_Titel
High Assurance Systems Engineering (HASE), 2015 IEEE 16th International Symposium on
Conference_Location
Daytona Beach Shores, FL
Print_ISBN
978-1-4799-8110-6
Type
conf
DOI
10.1109/HASE.2015.39
Filename
7027434
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