An Incremental Approach for Model-Based Test Suite Reduction Using Formal Concept Analysis

Author

Ng, Pin ; Fung, Richard Y K

Author_Institution

Hong Kong Community Coll., Hong Kong Polytech. Univ., Hong Kong, China

fYear

2009

fDate

20-22 Dec. 2009

Firstpage

1

Lastpage

6

Abstract

Model-based test suite reduction aims to provide a smaller set of test scenarios which can preserve the original test coverage with respect to some testing criteria. We are proposing to apply Formal Concept Analysis (FCA) in analyzing the association between a set of test scenarios with a set of transitions specified in a state machine model. By utilizing the properties of concept lattice, we are able to incrementally determine a minimal set of test scenarios with adequate test coverage.

Keywords

finite state machines; formal verification; program testing; concept lattice properties; formal concept analysis; incremental approach; model-based test suite reduction; state machine model; transition set; Computer aided software engineering; Educational institutions; Embedded software; Lattices; Organizing; Research and development management; Software systems; Software testing; System testing; Virtual manufacturing;

fLanguage

English

Publisher

ieee

Conference_Titel

Ubiquitous Information Technologies & Applications, 2009. ICUT '09. Proceedings of the 4th International Conference on

Conference_Location

Fukuoka

ISSN

1976-0035

Print_ISBN

978-1-4244-5131-9

Type

conf

DOI

10.1109/ICUT.2009.5405725

Filename

5405725