• DocumentCode
    3377239
  • Title

    Thin-film poly-SI solar cells on AIT-textured glass - importance of the rear reflector

  • Author

    Widenborg, P.L. ; Chan, S. ; Walsh, T. ; Aberle, A.G.

  • Author_Institution
    ARC Photovoltaics Centre of Excellence, The University of New South Wales, UNSW Sydney NSW 2052, Australia
  • fYear
    2008
  • fDate
    11-16 May 2008
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    EQE measurements were performed on thin-film poly-Si solar cells fabricated by the solid phase crystallisation method of PECVD a-Si:H (PLASMA cells). PC1D simulation showed that a SiO2/aluminium rear reflector is superior to an aluminium reflector. A promising Jsc.EQE value of 23 mA/cm2 has been obtained for a 3 microns thick PLASMA poly-Si solar cell on Aluminium-Induced Texture (AIT) textured glass having a SiO2/aluminium rear reflector.
  • Keywords
    Aluminum; Crystallization; Glass; Performance evaluation; Phase measurement; Photovoltaic cells; Plasma measurements; Plasma simulation; Solids; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922509
  • Filename
    4922509
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3377239