• DocumentCode
    3377530
  • Title

    Mixed-signal system-on-chip verification using a recursively-verifying-modeling (RVM) methodology

  • Author

    Shi, C. J Richard

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Washington, Seattle, WA, USA
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    1432
  • Lastpage
    1435
  • Abstract
    The verification of mixed-signal SoC is emerging as the most significant challenge, and with its cost surpassing the chip design cost. This paper presents a new automated verification methodology namely RVM (recursively verifying and modeling) and a set of supporting electronic design automation tools. The RVM methodology is built on the existing design flow and environments but with three major innovations to cope with custom-designed transistor blocks: a tool for automatically generating and validating simulation-efficiently behavioral models from a circuit netlist, a tool for characterizing and verifying the electrical rule correctness of analog blocks, and a hierarchical environment that allows designers to control the modeling and verification complexity. With the RVM methodology, analog circuits are verified in a way similar to the well-established digital verification. A set of industry benchmark results have shown that the RVM methodology is cable of reducing the verification time by potentially 100× to 1000×. With the increasing complexity of full-chip mixed-signal system-on-chip design, the RVM methodology is emerging as the only scalable verification solution.
  • Keywords
    circuit complexity; integrated circuit design; mixed analogue-digital integrated circuits; system-on-chip; RVM methodology; analog circuits; automated verification methodology; chip design cost; circuit netlist; custom-designed transistor; electronic design automation tools; full-chip mixed-signal system-on-chip design; mixed-signal SoC verification; mixed-signal system-on-chip verification; recursive verifying modeling methodology; simulation-efficiently behavioral model validation; verification complexity; Analog circuits; Automatic generation control; Character generation; Chip scale packaging; Circuit simulation; Costs; Electrical equipment industry; Electronic design automation and methodology; System-on-a-chip; Technological innovation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537313
  • Filename
    5537313