• DocumentCode
    3377778
  • Title

    Timing yield optimization via discrete gate sizing using globally-informed delay PDFs

  • Author

    Dutt, Shantanu ; Ren, Huan

  • Author_Institution
    Dept. of ECE, Univ. of Illinois, Chicago, IL, USA
  • fYear
    2010
  • fDate
    7-11 Nov. 2010
  • Firstpage
    570
  • Lastpage
    577
  • Abstract
    We develop two novel globally-informed gate-sizing algorithms for tackling the problems of statistical circuit timing optimization under a timing yield constraint, and timing yield optimization under a timing (i.e., delay) constraint. Unlike previous works, our techniques are global in the sense that they use objective functions that take into account either the entire circuit´s variabilities and available gate sizes or those of the statistically timing-critical part of the circuit. The actual optimization, using the aforementioned objective functions, was performed using a recently introduced efficient discrete optimization technique called discretized network flow (DNF). We compared our algorithms to a state-of-the-art sensitivity based method. Experimental results show an absolute yield improvement of up to 43% and an average of 37% for the best of our two techniques over that of a non-statistical timing optimized circuit (optimized using a recent state-of-the-art method) based on the worst-case delay estimate for each gate. Our technique also gives a 19% better relative yield improvement over the sensitivity based method.
  • Keywords
    circuit optimisation; delays; statistics; timing; discrete gate sizing; discretized network flow; gate sizes; globally-informed gate-sizing algorithms; statistical circuit timing optimization; timing delay constraint; timing yield constraint; timing yield optimization; Delay; Gaussian distribution; Logic gates; Optimization; Sensitivity; Taylor series;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4244-8193-4
  • Type

    conf

  • DOI
    10.1109/ICCAD.2010.5654205
  • Filename
    5654205