• DocumentCode
    3378264
  • Title

    Practical finite difference time domain (FDTD) shielding analysis of thin coatings and shield bonding methods

  • Author

    Kraemer, John G.

  • Author_Institution
    Rockwell Collins Inc., Cedar Rapids, IA, USA
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    854
  • Abstract
    Thin coatings such as indium tin oxide (ITO) or gold splatter on glass are often used on electronic display enclosures for shielding to allow compliance with radiated emissions standards while allowing optical transmission. The thin coatings are often bonded to the display enclosure to allow realization of the maximum shielding. The bonding is often accomplished by the use of a conductive gasket that mates with a busbar on one or more edges of the thin coating. Shielding effectiveness of the coating and gasket configuration is very difficult to predict using traditional shielding effectiveness equations. This paper shows how 3-dimensional (3D) finite difference time domain (FDTD) simulation and analysis are used to examine trends in shielding effectiveness with respect to gasket characteristics, thin coating characteristics (thickness and conductivity), and bonding methods. Practical simulation and model setup methods are presented. Results are provided for common configurations
  • Keywords
    adhesion; busbars; coatings; digital simulation; display instrumentation; electromagnetic interference; electromagnetic shielding; finite difference time-domain analysis; packaging; 3D FDTD simulation; Au; ITO; InSnO; busbar; conductive gasket; conductivity; electronic display enclosures; finite difference time domain; gasket configuration; glass; gold; indium tin oxide; maximum shielding; model setup methods; optical transmission; practical finite difference time domain; radiated emissions standards; shield bonding methods; shielding analysis; shielding effectiveness equations; thickness; thin coatings; Bonding; Coatings; Displays; Finite difference methods; Gaskets; Glass; Gold; Indium tin oxide; Stimulated emission; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1999 IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    0-7803-5057-X
  • Type

    conf

  • DOI
    10.1109/ISEMC.1999.810157
  • Filename
    810157