Title :
Charge-delay (Qt) as a performance metric for low-power CMOS circuit design
Author :
Tran, Hiep ; Aton, Thomas
Author_Institution :
Integrate Syst. Lab., Texas Instrum. Inc., Dallas, TX, USA
fDate :
31 May-2 Jun 1995
Abstract :
The advent of low-power design has created a need for a metric (Figure of Merit) that is convenient to use in technical communications as well as a design guide. This paper examines a few common metrics for evaluating low-power CMOS circuit design effectiveness. It identifies charge-delay product (Qt) as a convenient and balanced metric. This function has an optimum point offering a better criterion than other common metrics for circuits that have operating margins that depend on the circuit delays
Keywords :
CMOS integrated circuits; delays; integrated circuit design; charge-delay product; circuit delays; figure of merit; low-power CMOS circuit design; performance metric; Circuit synthesis; Delay effects; Design optimization; Frequency; Instruments; Laboratories; Measurement; Professional communication; Switching circuits; Threshold voltage;
Conference_Titel :
VLSI Technology, Systems, and Applications, 1995. Proceedings of Technical Papers. 1995 International Symposium on
Conference_Location :
Taipei
Print_ISBN :
0-7803-2773-X
DOI :
10.1109/VTSA.1995.524715