DocumentCode :
3378325
Title :
Self-Aligned Stylus with High Sphericity for Micro Coordinate Measurement
Author :
Tsai, Y.-C. ; Chang, D.-R. ; Tsao, L.-C. ; Wu, M.-D. ; Shih, P.-J. ; Shih, W.-P.
Author_Institution :
Nat. Taiwan Univ., Taipei
fYear :
2007
fDate :
10-14 June 2007
Firstpage :
1641
Lastpage :
1644
Abstract :
This paper presents a mask-free fabrication of styluses with high sphericity for micro coordinate measurement machine (muCMM), a mechanical system using micro-scale contact probes to measure the profile of high-aspect-ratio micro-structures. This new process combines micro-pellet and stylus into one mechanical device. The micro-pellets are self-configured inside aqueous environment in which the surface tension deforms the pellets into prefect spheres. Stylus arrays were patterned by self-aligned waveguides. This process enables the center of the micro-sphere to accurately coincide with the longitudinal axis of stylus and hence the Abbe error for the muCMM can be significantly reduced.
Keywords :
micromachining; micromechanical devices; waveguides; Abbe error; mask-free fabrication; mechanical system; micro-scale contact probes; microcoordinate measurement machine; self-aligned stylus; stylus arrays; surface tension; waveguides; Coordinate measuring machines; Displacement measurement; Fabrication; Gravity; Lenses; Mechanical variables measurement; Microoptics; Probes; Scanning electron microscopy; Surface tension; Self-alignment; micro coordinate measurement; spherical stylus;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
Conference_Location :
Lyon
Print_ISBN :
1-4244-0842-3
Electronic_ISBN :
1-4244-0842-3
Type :
conf
DOI :
10.1109/SENSOR.2007.4300464
Filename :
4300464
Link To Document :
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