DocumentCode
3378484
Title
An alternate, complementary method for characterizing EMI filters
Author
Mardiguian, Michel ; Raimbourg, Joel
Author_Institution
2, Allee des Chataigniers, St. Remy, France
Volume
2
fYear
1999
fDate
1999
Firstpage
882
Abstract
Proper characterization of EMI filters has always been a problem, since real-life application never replicates the impedances of the test set-up. This paper analyzes filter insertion loss in actual EUT configurations, compared to the artificial data of Mil Std220 or CISPR 17, and recommends a complementary method using the LISN as a test load
Keywords
circuit testing; electric impedance; electromagnetic compatibility; electromagnetic interference; measurement standards; passive filters; CISPR 17; EMC test; EUT configurations; LISN; Mil Std220; characterization; characterizing EMI filters; complementary method; filter insertion loss; impedances; real-life application; test load; test set-up; Capacitors; Circuit analysis; Delta modulation; Electromagnetic compatibility; Electromagnetic interference; Filters; Impedance; Inductors; Insertion loss; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location
Seattle, WA
Print_ISBN
0-7803-5057-X
Type
conf
DOI
10.1109/ISEMC.1999.810171
Filename
810171
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