Title :
An alternate, complementary method for characterizing EMI filters
Author :
Mardiguian, Michel ; Raimbourg, Joel
Author_Institution :
2, Allee des Chataigniers, St. Remy, France
Abstract :
Proper characterization of EMI filters has always been a problem, since real-life application never replicates the impedances of the test set-up. This paper analyzes filter insertion loss in actual EUT configurations, compared to the artificial data of Mil Std220 or CISPR 17, and recommends a complementary method using the LISN as a test load
Keywords :
circuit testing; electric impedance; electromagnetic compatibility; electromagnetic interference; measurement standards; passive filters; CISPR 17; EMC test; EUT configurations; LISN; Mil Std220; characterization; characterizing EMI filters; complementary method; filter insertion loss; impedances; real-life application; test load; test set-up; Capacitors; Circuit analysis; Delta modulation; Electromagnetic compatibility; Electromagnetic interference; Filters; Impedance; Inductors; Insertion loss; Testing;
Conference_Titel :
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5057-X
DOI :
10.1109/ISEMC.1999.810171
