Title :
Testing interconnects: a pin adjacency approach
Author :
McBean, D. ; Moore, W.R.
Author_Institution :
Dept. of Eng. Sci., Oxford Univ., UK
Abstract :
This paper looks at a new fault model used for shorts between nets on a PCB, the pin-adjacency fault model, and the implementation of two algorithms. The pin-adjacency detection and diagnosis algorithms for detecting and diagnosing these bridging faults. The authors represent the nets and their likelihood to short as a graph, and in conjunction with the new algorithms are able to generate reduced test sets. This represents a huge saving over existing algorithms which assume that any two nets are likely to short, as opposed to the new more realistic pin-adjacency fault model
Keywords :
boundary scan testing; fault location; logic testing; printed circuit testing; boundary scan testing; fault model; interconnects testing; pin adjacency; shorts; Bridges; Copper; Fault detection; Fault diagnosis; Lead; Logic testing; Pins; Sequential analysis;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246596