DocumentCode
3379012
Title
Testing analog circuits by using a sigma-delta modulator
Author
Huertas, J.L. ; Rueda, A. ; Vazquez, D.
Author_Institution
Dept. of Design of Analog Circuits, Centro Nacional de Microelectron., Sevilla, Spain
fYear
1993
fDate
19-22 Apr 1993
Firstpage
524
Lastpage
525
Abstract
The use of sigma-delta modulators to improve the testability in analog and mixed-signal integrated circuits is discussed in this contribution. The proposed idea can be considered as a starting point for exploring the future capabilities offered by simplified data conversion subsystems to design for testability methodologies applicable to mixed-signal chips
Keywords
design for testability; integrated circuit testing; linear integrated circuits; mixed analogue-digital integrated circuits; modulators; data conversion; mixed-signal integrated circuits; sigma-delta modulator; testability; Analog circuits; Analog-digital conversion; CMOS technology; Circuit testing; Communication cables; Data conversion; Delta-sigma modulation; Design for testability; Digital modulation; Filters;
fLanguage
English
Publisher
ieee
Conference_Titel
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location
Rotterdam
Print_ISBN
0-8186-3360-3
Type
conf
DOI
10.1109/ETC.1993.246613
Filename
246613
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