Title :
Mixed-signal automatic test program generation
Author :
Keady, Aidan ; Lyden, Colin ; Ryan, John ; Claffey, S. ; Murphy, Noel ; Long, Brian
Author_Institution :
Nat. Microelectron. Res. Centre, Univ. Coll., Cork, Ireland
Abstract :
A novel program is presented which automates the generation of test programs for analogue and mixed-signal integrated circuits. The tests are entered graphically by the IC designer, providing a link between the design and test stages in IC development. The program developed can be used with any schematic entry front end capable of writing EDIF 200 netlists. The tests entered are checked by the program to ensure the tester has the necessary resources available and tester code is generated without further user input
Keywords :
automatic testing; design for testability; electronic engineering computing; integrated circuit testing; linear integrated circuits; mixed analogue-digital integrated circuits; C language; EDIF 200 netlists; IC development; analogue circuits testing; automatic test program generation; mixed-signal integrated circuits; Analog integrated circuits; Automatic testing; Circuit testing; Educational institutions; Integrated circuit testing; Microelectronics; Packaging; Signal generators; Software testing; Writing;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246615
