DocumentCode :
3379099
Title :
Efficient production technology for microcrystalline silicon solar cells using a Localized Plasma Confinement (LPC) CVD method
Author :
Kunii, Toshie ; Murata, Kazuya ; Matsumoto, Mitsuhiro ; Kawamoto, Kunihiro ; Kobayashi, Yasutaka ; Aya, Youichirou ; Nakagawa, Makoto ; Terakawa, Akira ; Tanaka, Makoto
Author_Institution :
Advanced Energy Research Center, SANYO Electric Co., Ltd., 7-3-2, Ibukidai-Higashi, Kobe, 651-2242 Hyogo, JAPAN
fYear :
2008
fDate :
11-16 May 2008
Firstpage :
1
Lastpage :
5
Abstract :
A very high deposition rate for high-quality microcrystalline silicon (μc-Si) films has been achieved under very high-pressure conditions (≫ 1,000 Pa) using a Localized Plasma Confinement (LPC)-CVD method which has a special cathode. The uniformity of the μc-Si film thickness was 2.4% on a 55×65 cm2 glass substrate with a deposition rate of 2.7 nm/s. We also achieved maximum conversion efficiency of 11.4% for an a-Si/μc-Si tandem solar cell (1 cm2) on a 20×20 cm2 glass substrate and average conversion efficiency of 9.84% for a-Si/μc-Si tandem solar cells (1 cm2) on a 55×65 cm2 glass substrate with a deposition rate (Rd) of 1.8 nm/s. These results indicate that LPC-CVD method is a good candidate as an effective production technology for large-area, high-performance μc-Si thin-film solar cells.
Keywords :
Cathodes; Glass; Linear predictive coding; Photovoltaic cells; Plasma confinement; Production; Semiconductor films; Silicon; Substrates; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
Conference_Location :
San Diego, CA, USA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-1640-0
Electronic_ISBN :
0160-8371
Type :
conf
DOI :
10.1109/PVSC.2008.4922609
Filename :
4922609
Link To Document :
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