DocumentCode
3379165
Title
Application of measured twinax cable S-parameters for transient circuit simulations
Author
Chen, Zhaoqing
Author_Institution
IBM Corp., Poughkeepsie, NY
fYear
2007
fDate
13-16 May 2007
Firstpage
179
Lastpage
181
Abstract
Practical methods of making use of measured twinax cable S-parameters for transient circuit simulations are discussed and compared. Due to extremely long delay of the cable, most available tools fail or give inaccurate simulation results if we use the measured S-Parameters directly. Careful verification is absolutely necessary for any tool. For complex tasks like the worst-case eye diagram with nonlinear I/O devices, we still need more accurate and faster methodologies. This long delay case has been accepted as a very good benchmark for testing S-parameter based SPICE modeling tools and the transient simulation tools implemented with the S-parameter convolution method.
Keywords
S-parameters; SPICE; cables (electric); circuit simulation; S-parameter convolution method; SPICE modeling tools; nonlinear I/O devices; transient circuit simulations; twinax cable S-Parameters; Benchmark testing; Circuit simulation; Circuit testing; Convolution; Crosstalk; Delay; Packaging; SPICE; Scattering parameters; Signal analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Propagation on Interconnects, 2007. SPI 2007. IEEE Workshop on
Conference_Location
Genova
Print_ISBN
978-1-4244-1223-5
Electronic_ISBN
978-1-4244-1224-2
Type
conf
DOI
10.1109/SPI.2007.4512244
Filename
4512244
Link To Document