• DocumentCode
    3379165
  • Title

    Application of measured twinax cable S-parameters for transient circuit simulations

  • Author

    Chen, Zhaoqing

  • Author_Institution
    IBM Corp., Poughkeepsie, NY
  • fYear
    2007
  • fDate
    13-16 May 2007
  • Firstpage
    179
  • Lastpage
    181
  • Abstract
    Practical methods of making use of measured twinax cable S-parameters for transient circuit simulations are discussed and compared. Due to extremely long delay of the cable, most available tools fail or give inaccurate simulation results if we use the measured S-Parameters directly. Careful verification is absolutely necessary for any tool. For complex tasks like the worst-case eye diagram with nonlinear I/O devices, we still need more accurate and faster methodologies. This long delay case has been accepted as a very good benchmark for testing S-parameter based SPICE modeling tools and the transient simulation tools implemented with the S-parameter convolution method.
  • Keywords
    S-parameters; SPICE; cables (electric); circuit simulation; S-parameter convolution method; SPICE modeling tools; nonlinear I/O devices; transient circuit simulations; twinax cable S-Parameters; Benchmark testing; Circuit simulation; Circuit testing; Convolution; Crosstalk; Delay; Packaging; SPICE; Scattering parameters; Signal analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Propagation on Interconnects, 2007. SPI 2007. IEEE Workshop on
  • Conference_Location
    Genova
  • Print_ISBN
    978-1-4244-1223-5
  • Electronic_ISBN
    978-1-4244-1224-2
  • Type

    conf

  • DOI
    10.1109/SPI.2007.4512244
  • Filename
    4512244