Title :
A test strategy for object-oriented programs
Author :
Kung, David ; Gao, Jerry ; Hsia, Pei ; Toyoshima, Yasufumi ; Chen, Cris
Author_Institution :
Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
Abstract :
The complexity and interdependencies of an object oriented program makes testing of such programs difficult. We present a reverse engineering based model called Object Relation Diagram (ORD), which is generated from analyzing the C++ source code of an object oriented program. An ORD is a directed graph in which the vertices represent the object classes and the edges represent the relationships among the object classes. Based on the ORD, a test strategy, called test order, for unit testing and integration testing of object oriented programs is described. The test order algorithm uses topological sorting and clusters of strongly connected subgraphs of the ORD. It computes the optimal test order in the sense that the effort required to construct the test stubs to simulate the untested classes/member functions is minimum. We show the savings of the test strategy through statistics of the InterViews library
Keywords :
C language; object-oriented languages; object-oriented programming; program testing; reverse engineering; C++ source code; InterViews library; ORD; Object Relation Diagram; directed graph; integration testing; object classes; object oriented program; object oriented programs; object-oriented programs; optimal test order; reverse engineering based model; strongly connected subgraphs; test order; test order algorithm; test strategy; test stubs; topological sorting; unit testing; untested classes/member functions; vertices; Clustering algorithms; Computer industry; Computer science; Industrial relations; Object oriented modeling; Reverse engineering; Software libraries; Software testing; Sorting; Statistical analysis;
Conference_Titel :
Computer Software and Applications Conference, 1995. COMPSAC 95. Proceedings., Nineteenth Annual International
Conference_Location :
Dallas, TX
Print_ISBN :
0-8186-7119-X
DOI :
10.1109/CMPSAC.1995.524786