Title :
Multi-chains encoding scheme in low-cost ATE
Author :
Chen, Gong-Han ; Wu, Po-Han ; Rau, Jiann-Chyi
Author_Institution :
Dept. of Electr. Eng., Tamkang Univ., Tamsui, Taiwan
fDate :
May 30 2010-June 2 2010
Abstract :
Generally speaking, the dependency data compression is very useful for Intellectual Property (IP) cores and SoC. We consider the shift-in power and compression ratio in low-cost ATE environment. We propose new compression architecture with fixed length for running ones. We suppose that the ATE has not repeated function and synchronization signal. In the results, when the complexity of VLSI circuit is growing up, the number of input pins for testing is very low. The average compression ratio of our method is 63% for MinTest on ISCAS´89 benchmarks. The average of peak/WTC shift-in turns to 3×/6.6×, after comparing Selective Scan Slice (SSS) and our method. The average of hardware overhead is 6%.
Keywords :
VLSI; automatic test equipment; circuit complexity; data compression; encoding; industrial property; integrated circuit testing; system-on-chip; ISCAS´89 benchmark mintest; SoC; VLSI circuit complexity; automatic test equipment; average compression ratio; compression architecture; intellectual property core; low-cost ATE; multichain encoding scheme; selective scan slice; Circuit testing; Data compression; Encoding; Energy consumption; Filling; Frequency synchronization; Hardware; Logic; Power dissipation; Very large scale integration;
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
DOI :
10.1109/ISCAS.2010.5537430