• DocumentCode
    3379707
  • Title

    Application based reliability assessment and qualification methodology for medical ICs

  • Author

    Zhu, Xiaowei ; Vasanth, Karthik ; Xu, Xiaochen ; Smyth, Charles ; Rhoton, Brent

  • Author_Institution
    High Performance Analog, Med./HiRel Bus. Group, Texas Instrum., Dallas, TX, USA
  • fYear
    2011
  • fDate
    10-14 April 2011
  • Abstract
    Reliability assessment and qualification system has strong economic implications for both manufacturers and customers. The best system should have a good balance among cost of verification, market timing requirement, and acceptable risk that meets the targeted user´s application conditions and requirements. With the increasing use of innovative electronics in the medical applications, it becomes difficult to have a single reliability assessment and qualification approach to serve all applications. In this paper, we review the existing reliability assessment and qualification framework, and discuss their applicability in medical ICs. We will discuss the tradeoff and challenges in defining reliable medical IC products based on the application demands using a couple of medical IC examples.
  • Keywords
    biomedical electronics; biomedical ultrasonics; semiconductor device reliability; innovative electronics; market timing requirement; medical IC; qualification methodology; reliability assessment; ultrasound; Acceleration; Biomedical imaging; Qualifications; Reliability; Temperature; Temperature measurement; Ultrasonic imaging; aging; medical IC; qualification; reliability assessment; ultrasound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2011 IEEE International
  • Conference_Location
    Monterey, CA
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4244-9113-1
  • Electronic_ISBN
    1541-7026
  • Type

    conf

  • DOI
    10.1109/IRPS.2011.5784482
  • Filename
    5784482