Resilient microprocessor design for improving performance and energy efficiency

In this tutorial, a 45nm resilient microprocessor core with error-detection and recovery circuits demonstrates the opportunity for improving performance and energy efficiency by mitigating the impact of dynamic parameter variations. The design methodology describes the additional steps beyond a standard design flow for integrating error-detection and recovery circuits into a microprocessor core. Silicon measurements indicate that the resilient design enables a 41% throughput benefit at iso-energy or a 22% energy reduction at iso-throughput, as compared to a conventional design.