• DocumentCode
    3380937
  • Title

    Minority carrier dynamics in polycrystalline silicon solar cells studied by photo-assisted Kelvin probe force microscopy

  • Author

    Takihara, Masaki ; Ujihara, Toru ; Takahashi, Takuji

  • Author_Institution
    Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, 153-8505 Japan
  • fYear
    2008
  • fDate
    11-16 May 2008
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In a solar cell material, minority carrier dynamics such as diffusion length and lifetime are very important because they strongly influence on solar cell performance. In this study, we proposed a method for diffusion length and lifetime measurements by photo-assisted Kelvin probe force microscopy (P-KFM), and investigated the diffusion length and lifetime distribution around a grain boundary in a polycrystalline silicon solar cell.
  • Keywords
    Atomic force microscopy; Force measurement; Kelvin; Length measurement; Optical modulation; Optical surface waves; Photovoltaic cells; Probes; Silicon; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922689
  • Filename
    4922689