• DocumentCode
    338148
  • Title

    Dynamic testing on A. D. C. stuck fault tester

  • Author

    Whitley, Wayne P. ; Drinkhouse, Eric W. ; Newsom, Tom H.

  • Author_Institution
    IBM Corporation
  • fYear
    1978
  • fDate
    1978
  • Firstpage
    262
  • Lastpage
    264
  • Keywords
    Automatic logic units; Automatic testing; Circuit faults; Circuit testing; Logic testing; Microprocessors; Pins; Power system modeling; Sequential circuits; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '78. International Automatic Testing Conference
  • Type

    conf

  • DOI
    10.1109/AUTEST.1978.764377
  • Filename
    764377
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=338148