DocumentCode :
3381782
Title :
A time-domain flash ADC immune to voltage controlled delay line non-linearity
Author :
Kim, Young-Hwa ; Cho, SeongHwan
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
fYear :
2011
fDate :
25-28 Oct. 2011
Firstpage :
469
Lastpage :
471
Abstract :
A Flash analog-to-digital converter (ADC) architecture operating in time-domain is presented. The proposed ADC uses voltage controlled delay lines (VCDLs) and time-domain comparators instead of pre-amplifiers and voltage-domain comparators in the conventional Flash ADC. Due to the time-domain operation, the proposed Flash ADC benefits from fast switching speed of advanced CMOS process. A key property of the proposed ADC is that its linearity is not affected by the non-linearity of the VCDL, due to the identical VCDLs that are used in both the input signal and reference voltages.
Keywords :
CMOS integrated circuits; analogue-digital conversion; comparators (circuits); delay lines; voltage control; advanced CMOS process; analog-to-digital converter; time-domain comparators; time-domain flash ADC immune; voltage controlled delay line nonlinearity; voltage-domain comparators; Logic gates; Service oriented architecture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC (ASICON), 2011 IEEE 9th International Conference on
Conference_Location :
Xiamen
ISSN :
2162-7541
Print_ISBN :
978-1-61284-192-2
Electronic_ISBN :
2162-7541
Type :
conf
DOI :
10.1109/ASICON.2011.6157223
Filename :
6157223
Link To Document :
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