• DocumentCode
    3384673
  • Title

    Dynamic power and thermal integrity in 3D integration

  • Author

    Yu, Hao ; He, Lei

  • Author_Institution
    Berkeley Design Autom., Santa Clara, CA, USA
  • fYear
    2009
  • fDate
    23-25 July 2009
  • Firstpage
    1108
  • Lastpage
    1112
  • Abstract
    This paper presents a state-of-art advance in 3D integrations. It illustrates the need for a high-performance 3D design driven by dynamic power and thermal integrity. The through-silicon-via (TSV) is used to simultaneously deliver power supply and remove heat. More importantly, to cope with the large-scale design complexity, the modern macromodeling technique is applied to handle not only large numbers of dynamic inputs/working-loads but also large sizes of RLC/RC networks distributing the power/heat. Experiments applying the 3D design presented by this paper showed promising results to reduce both runtime and resource.
  • Keywords
    RC circuits; RLC circuits; VLSI; integrated circuit design; thermal analysis; 3D integrated circuits; RC network; RLC network; VLSI integration; dynamic power integrity; high-performance 3D design; large-scale design complexity; macromodeling technique; thermal integrity; through-silicon-via technique; Dielectrics; Helium; Large-scale systems; Logic circuits; Packaging; Power supplies; Temperature; Thermal resistance; Through-silicon vias; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Circuits and Systems, 2009. ICCCAS 2009. International Conference on
  • Conference_Location
    Milpitas, CA
  • Print_ISBN
    978-1-4244-4886-9
  • Electronic_ISBN
    978-1-4244-4888-3
  • Type

    conf

  • DOI
    10.1109/ICCCAS.2009.5250320
  • Filename
    5250320