Thermally stimulated current characterization of poly(ether ether ketone) [PEEK]

Author

Mourgues-Martin, M. ; Bernes, A. ; Lacabanne, C.

Author_Institution

Solid State Phys. Lab., Toulouse Univ., France

fYear

1992

fDate

7-10 Jun 1992

Firstpage

291

Lastpage

293

Abstract

Thermally stimulated current (TSC) spectroscopy was applied to the characterization of poly(ether ether ketone) [PEEK]. The dielectric relaxation mode associated with the glass transition was analyzed as a function of the degree of crystallinity. The aim was to characterize the microstructure of the amorphous phase. The effect of the degree of crystallinity on the coupling of the crystalline and the amorphous phase was investigated. The authors used differential scanning calorimetry (DSC) as a reference technique for determination of the transition spectra. Thermograms were recorded at a scanning rate of 20 K/min^-1. PEEK was supplied in the form of sheets with a thickness of 0.25 mm; the degree of crystallinity was 10%. A compensation study with sheets having 28% degree of crystallinity was carried out. The dielectric relaxation mode association with the glass transition showed the existence of two amorphous phases

Keywords

dielectric relaxation; glass transition (polymers); polymer structure; polymers; thermally stimulated currents; PEEK; TSC characterisation; amorphous phases; degree of crystallinity; dielectric relaxation mode; differential scanning calorimetry; glass transition; thermoplastic polymer; transition spectra; Amorphous materials; Calorimetry; Crystal microstructure; Crystallization; Glass; Polarization; Solid state circuits; Spectroscopy; Temperature; Thermal resistance;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation, Conference Record of the 1992 IEEE International Symposium on

Conference_Location

Baltimore, MD

ISSN

1089-084X

Print_ISBN

0-7803-0649-X

Type

conf

DOI

10.1109/ELINSL.1992.246999

Filename

246999