Towards an understanding of no trouble found devices

Author

Davidson, Scott

Author_Institution

Sun Microsystems, Inc., Sunnyvale, CA, USA

fYear

2005

fDate

1-5 May 2005

Firstpage

147

Lastpage

152

Abstract

This paper gives a model for understanding no trouble found (NTF) parts, including predictions of how many can be expected at different stages of a product life cycle, an understanding of when NTFs are of concern, and when they are to be expected. We also show how NTF rates can be used as a measure of process health.

Keywords

integrated circuit testing; microprocessor chips; production testing; SUN Sparc microprocessor; integrated circuit testing; no trouble found devices; process health measurement; product life cycle; Analytical models; Data analysis; Integrated circuit testing; Life testing; Manufacturing processes; Microprocessors; Predictive models; Sun; System testing; Waste materials;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2005. Proceedings. 23rd IEEE

ISSN

1093-0167

Print_ISBN

0-7695-2314-5

Type

conf

DOI

10.1109/VTS.2005.86

Filename

1443413

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3387124