• DocumentCode
    3388045
  • Title

    3D X-ray diffraction imaging for materials ID

  • Author

    Evans, Paul ; Rogers, Keith

  • Author_Institution
    Imaging Sci. Group, Nottingham Trent Univ., Nottingham, UK
  • fYear
    2010
  • fDate
    8-10 Nov. 2010
  • Firstpage
    325
  • Lastpage
    329
  • Abstract
    We present a 3D imaging technique, which combines the novel acquisition of diffracted X-ray signals and X-ray absorption data. The relatively high intensity of the diffraction signals afforded by our new approach has important implications for high specificity and high sensitivity security scanning applications. Our technique utilises a configuration of a tubular X-ray beam incident upon a ring absorption sensor and a diffraction sensor. The relative translation of the object under inspection enables the 3D scanning of extended objects. The sensing arrangement focuses on planes normal to the symmetry axis of the interrogating X-ray beam. Orders of magnitude increase in the intensity of the diffraction signal is possible in comparison with conventional angular dispersive methods. Our transmission mode approach effects a convergent and therefore inherently compact, diffracted ray geometry. We have undertaken initial testing and evaluation of this concept with various arrangements of objects fabricated from a range of different materials. The synthesis of the absorption and diffraction data is the basis for a new 3D imaging modality.
  • Keywords
    X-ray diffraction; X-ray imaging; 3D X-ray diffraction imaging; 3D imaging technique; 3D scanning; X-ray absorption data; diffracted X-ray signal; diffraction sensor; materials ID; ring absorption sensor; tubular X-ray beam; Absorption; Diffraction; Geometry; Imaging; Materials; X-ray diffraction; X-ray imaging; X-ray diffraction; coherent scatter; materials identification; security screening;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Technologies for Homeland Security (HST), 2010 IEEE International Conference on
  • Conference_Location
    Waltham, MA
  • Print_ISBN
    978-1-4244-6047-2
  • Type

    conf

  • DOI
    10.1109/THS.2010.5654928
  • Filename
    5654928